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ZEISS Sigma
Güvenilir yüksek çözünürlüklü görüntüleme ve analize erişin
ZEISS Sigma, kanıtlanmış ZEISS Gemini teknolojisine dayanmaktadır. Gemini objektif lens tasarımı, optik performansı en üst düzeye çıkarmak ve numunedeki alan etkilerini en aza indirmek için elektrostatik ve manyetik alanları bir araya getirir. Bu da manyetik malzemeler gibi zorlu numunelerde bile mükemmel görüntüleme sağlar.
Endüstri için ZEISS Sigma
Numunelerinizi test ederken yeni bir kalite düzeyini deneyimleyin
![]({"xsmall":"https://www.zeiss.com.tr/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/sigma/eds-detector_sigma.jpg/_jcr_content/renditions/original.image_file.100.56.file/eds-detector_sigma.jpg","small":"https://www.zeiss.com.tr/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/sigma/eds-detector_sigma.jpg/_jcr_content/renditions/original.image_file.360.203.file/eds-detector_sigma.jpg","medium":"https://www.zeiss.com.tr/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/sigma/eds-detector_sigma.jpg/_jcr_content/renditions/original.image_file.768.432.file/eds-detector_sigma.jpg","large":"https://www.zeiss.com.tr/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/sigma/eds-detector_sigma.jpg/_jcr_content/renditions/original.image_file.1024.576.file/eds-detector_sigma.jpg","xlarge":"https://www.zeiss.com.tr/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/sigma/eds-detector_sigma.jpg/_jcr_content/renditions/original.image_file.1280.720.file/eds-detector_sigma.jpg","xxlarge":"https://www.zeiss.com.tr/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/sigma/eds-detector_sigma.jpg/_jcr_content/renditions/original.image_file.1440.810.file/eds-detector_sigma.jpg","max":"https://www.zeiss.com.tr/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/sigma/eds-detector_sigma.jpg/_jcr_content/renditions/original./eds-detector_sigma.jpg"})
Gemini lens içi algılama konsepti, ikincil (SE) ve/veya geri saçılan (BSE) elektronları algılayarak verimli sinyal algılama sağlar ve böylece görüntü alma süresini en aza indirir. Gemini ışın güçlendirme teknolojisi, küçük boyutlarda prob kullanımına olanak tanır ve yüksek sinyal-gürültü oranlarını garanti eder.
En son algılama teknolojisi ile tüm numunelerinizi karakterize edebilirsiniz. Yeni ETSE dedektörü ve InLens dedektörü ile yüksek vakum modunda yüksek çözünürlüklü topografik bilgiler toplayın. VPSE veya C2D dedektör ile değişken basınç modunda net görüntüler elde edin. STEM dedektörü ile yüksek çözünürlüklü iletim görüntüleri üretin. HDBSD veya YAG dedektörü ile bileşimi araştırın.
![]({"xsmall":"https://www.zeiss.com.tr/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/sigma/sigma_all.jpg/_jcr_content/renditions/original.image_file.100.56.file/sigma_all.jpg","small":"https://www.zeiss.com.tr/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/sigma/sigma_all.jpg/_jcr_content/renditions/original.image_file.360.203.file/sigma_all.jpg","medium":"https://www.zeiss.com.tr/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/sigma/sigma_all.jpg/_jcr_content/renditions/original.image_file.768.432.file/sigma_all.jpg","large":"https://www.zeiss.com.tr/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/sigma/sigma_all.jpg/_jcr_content/renditions/original.image_file.1024.576.file/sigma_all.jpg","xlarge":"https://www.zeiss.com.tr/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/sigma/sigma_all.jpg/_jcr_content/renditions/original.image_file.1280.720.file/sigma_all.jpg","xxlarge":"https://www.zeiss.com.tr/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/sigma/sigma_all.jpg/_jcr_content/renditions/original.image_file.1440.810.file/sigma_all.jpg","max":"https://www.zeiss.com.tr/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/sigma/sigma_all.jpg/_jcr_content/renditions/original./sigma_all.jpg"})
Bir bakışta uygulama alanları
- Malzemelerin ve üretilen bileşenlerin hata analizi
- Çelik ve metallerin görüntülenmesi ve analizi
- Tıbbi cihazların muayenesi
- Proses kontrolü ve tanılamasında yarı iletken ve elektronik cihazların karakterizasyonu
- Yeni nanomalzemelerin yüksek çözünürlüklü görüntülenmesi ve analizi
- Kaplamaların ve ince filmlerin analizi
- Karbon ve diğer 2D malzemelerin çeşitli biçimlerinin karakterizasyonu
- Polimer malzemelerin görüntülenmesi, analizi ve farklılaştırılması
- Yaşlanma etkilerini ve kalite iyileştirme alanlarını anlamak için batarya araştırması yapılması
Otomatik partikül analizi ve çok modlu korelatif görüntüleme
![]({"xsmall":"https://www.zeiss.com.tr/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/sigma/samrtpi_tca.jpg/_jcr_content/renditions/original.image_file.100.56.0,0,1920,1082.file/samrtpi_tca.jpg","small":"https://www.zeiss.com.tr/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/sigma/samrtpi_tca.jpg/_jcr_content/renditions/original.image_file.360.203.0,0,1920,1082.file/samrtpi_tca.jpg","medium":"https://www.zeiss.com.tr/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/sigma/samrtpi_tca.jpg/_jcr_content/renditions/original.image_file.768.432.0,0,1920,1082.file/samrtpi_tca.jpg","large":"https://www.zeiss.com.tr/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/sigma/samrtpi_tca.jpg/_jcr_content/renditions/original.image_file.1024.576.0,0,1920,1082.file/samrtpi_tca.jpg","xlarge":"https://www.zeiss.com.tr/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/sigma/samrtpi_tca.jpg/_jcr_content/renditions/original.image_file.1280.720.0,0,1920,1082.file/samrtpi_tca.jpg","xxlarge":"https://www.zeiss.com.tr/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/sigma/samrtpi_tca.jpg/_jcr_content/renditions/original.image_file.1440.810.0,0,1920,1082.file/samrtpi_tca.jpg","max":"https://www.zeiss.com.tr/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/sigma/samrtpi_tca.jpg/_jcr_content/renditions/original.image_file.1920.1080.0,0,1920,1082.file/samrtpi_tca.jpg"})
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ZEISS SmartPI
ZEISS SmartPI, üretim ortamında rutin numunelerin tekrarlanabilir, yüksek hacimli analizi için tasarlanmıştır. Kontaminasyon verilerini tanımlama, analiz etme ve raporlama becerisi, proses kontrolüne yeni bir boyut kazandırır. Tam otomatik SEM partikül analizi ve sınıflandırmasındaki önemli iyileştirmelerden yararlanın. ZEISS SmartPI'nin üretkenliğinizi artırmasına, kalitenizi yükseltmesine ve kontaminasyon maliyetinizi azaltmasına izin verin. Morfoloji ve element bileşimine dayalı olarak ilgili partikülleri otomatik olarak algılar, ölçer, sayar ve sınıflandırır.
VDA 19.1 ve ISO 16232 gibi sektör standardı raporlar otomatik olarak oluşturulur
Bruker ve Oxford EDS sistemleri ile tam entegre ve uyumlu
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