Veri kalitesini sezgisel kullanımla birleştiren hepsi bir arada elektron mikroskobu
ZEISS EVO ailesindeki cihazlar, yüksek performanslı taramalı elektron mikroskobunu hem uzmanlara hem de yeni kullanıcılara hitap eden sezgisel, kullanıcı dostu bir deneyimle bir araya getirmektedir. İster malzeme bilimlerinde ister rutin endüstriyel kalite güvencesi ve hata analizi alanında faaliyet gösteriyor olun, ZEISS EVO, kapsamlı seçenek yelpazesi ile ihtiyaçlarınıza tam olarak uyarlanabilir.
ZEISS EVO, büyük ölçüde otomatik ve destekleyici iş akışları ile yüksek çözünürlüklü malzeme analizi gibi günlük tekrarlanabilir görüntüleme görevleri için tungsten veya LaB6 bazlı filamente sahip geleneksel giriş seviyesi sistemdir. Sistem, daha az zorlu yapı boyutları için esneklik sunar.
Uygulama alanları
Kalite analizi ve kalite kontrolü
Hata analizi ve fraktografi
Materyalografi
Temizlik muayenesi
ISO 16232 ve VDA 19 Bölüm 1 ve 2 standartlarını karşılamak için partiküllerin morfolojik ve kimyasal analizi
Metalik olmayan inklüzyonların analizi
ZEISS EVO: Veri kalitesini sezgisel kullanımla birleştiren hepsi bir arada elektron mikroskobu
Muayenenizi bir üst seviyeye yükseltin. ZEISS EVO, tam fiyat ve performans gereksinimlerinizi karşılamak için çeşitli yapılandırma seçenekleri sunar. İstediğiniz çözünürlüğü uygulamanızla eşleştirin ve üç oda boyutu arasından seçim yapın.
Numune türünüze uygun olarak yüksek vakum, değişken basınç veya ortam basıncını da tercih edebilirsiniz. Ardından SE, BSE, EDX, VP ve C2D dedektörleri arasından uygulamanıza uygun olanı seçin. ZEISS EVO ile elektron mikroskobunun avantajlarından uygun bir fiyatla yararlanabilirsiniz.
Uygulama örnekleri
Elektronik
Entegre devre yüzeyinde kalıntı ve kontaminasyon belirgindir. SE dedektörü ile 10 kV'de yüksek vakumda görüntülenmiştir.
Yakıt hücreleri
Yakıt hücreleri tipik olarak platin elektrotlar arasına sıkıştırılmış polimer elektrolit membranlardan oluşur. Yüzey detay bilgilerinin yüksek çözünürlükte elde edilmesi için bu kritik bileşenlerin düşük voltajlarda görüntülenmesi gerekir. LaB6 kaynağı (solda) ve tungsten kaynağı (sağda) ile 3 kV'de kesit. LaB6 kaynağı, düşük hızlandırma voltajlarında daha fazla yüzey detayı sağlar.
Galvanize yumuşak çelik
Galvanize yumuşak çeliğin kesiti, ZEISS EVO 15'teki SE dedektörü kullanılarak görüntülenmiştir. Sol: montaj reçinesi; orta: çinko katman; sağ: yumuşak çelik.
X-ray spektroskopisi (EDX) kullanılarak malzeme analizi
EDS haritası ile temsili korozyona uğramış yüzeylerin BSE görüntüleri: krom, kurşun, bakır, nikel, karbon ve oksijen.
Bilyalı rulman yüzeyinde hata analizi
BSE dedektörü ile görüntülenen bilyalı rulman yüzeyi, yüzey yapısında çatlama ve pullanma olduğunu ortaya koymaktadır.
Teknik Temizlik
Partikül filtresinden gelen partikül: teknik temizlik analizi ve kalite kontrolü.
ZEISS EVO Taramalı Elektron Mikroskobu - 90 Saniyede 10 Öne Çıkan Özellik
Üçüncü Taraf İçerikleri Engellendi
Çerez tercihlerinizden dolayı video oynatıcı engellendi. Ayarları değiştirmek ve videoyu oynatmak için lütfen aşağıdaki tuşa tıklayın ve "Fonksiyonel" izleme teknolojilerinin kullanımına izin verin.
Taramalı elektron mikroskobu ZEISS EVO'nun, acemi kullanıcılar için bile sezgisel görüntüleme sağlayarak kalite ve malzeme laboratuvarlarındaki rutin muayene ve hata analizi görevlerinizi nasıl desteklediğini öğrenin. EVO'nun öne çıkan özellikleri: - Yüksek çözünürlüklü görüntüleme - Verimli çalışma - Kimyasal bileşim analizi - Büyük iş parçaları - Geniş alan görüntü edinimi - İletken olmayan numuneler - EDX partikül analizi - Otomatik ölçümler - Akıllı görüntü segmentasyonu - Görüntü korelasyonu ve paylaşımı
Endüstri için diğer uygulamalar:
Faz, partikül ve kaynak analizi
Elektronik bileşenlerin, entegre devrelerin, MEMS cihazlarının ve güneş pillerinin görsel muayenesi
Bakır tel yüzeyinin ve kristal yapısının incelenmesi
Metal korozyonunun incelenmesi
Metaller arası fazların ve faz geçişlerinin analizi
Mikro çatlakların ve kırılma mukavemetinin görüntülenmesi ve analizi
Kaplamalar ve kompozit malzemeler üzerinde incelemeler
Kaynak dikişlerinin ve ısıdan etkilenen bölgelerin incelenmesi
ZEISS EVO ile samanlıktaki iğneyi buluyoruz.
Samanlıkta iğne aramak.
Teknik Temizlik: INNIO Group, ZEISS çözümünü kullanarak kalıntı kir partiküllerinin kimyasal bileşimini analiz ediyor.
Üçüncü Taraf İçerikleri Engellendi
Çerez tercihlerinizden dolayı video oynatıcı engellendi. Ayarları değiştirmek ve videoyu oynatmak için lütfen aşağıdaki tuşa tıklayın ve "Fonksiyonel" izleme teknolojilerinin kullanımına izin verin.
Doğru, güvenilir sonuçlar elbette önemlidir ancak bunları hızlı bir şekilde elde etmek de bir o kadar önemlidir.
Kalite güvencesi için mikroskopi uygulamaları:
Endüstri için endüstriden müşteri örnekleri ve broşür
ZEISS IQS, Mic and TCA, Success Story, INNIO Group, EN, PDF
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