Registration

Opening Speech 

Prof. Dr. Metin Salamcı / EKTAM

Extending Synchrotron X-ray Microscopy to the Laboratory

Dr. Antonio Casares / mSEM Business Development Manager (ZEISS)

Coffee Break

Qualification of CT Metrology for Additive Parts 

Emre Gündoğdu / Special Process Eng. Mngr. (GE)

Serdar Savaş / Principal Engineer for Inspection Technologies (GE)

Lunch

Performing Deffect Classification and Analysis of Parts Produced by Powder based Additive Manufacturing Method Using CT Method

Gökhan Çelik / Materials and Process Technologies/Senior Lead Engineer (ROKETSAN)

CT Applications at TEI: From Microstructure to Macro Performance

Çağdaş Şen / R&D and Innovation Directorate/Expert Engineer (TEI)

Coffee Break 

EKTAM Tour

Sample-in-Volume Analysis
(Correlative Imaging Technique, FIB-SEM)

Dr. Antonio Casares / mSEM Business Development Manager (ZEISS)

Scanning Electron Microscopy Fundamentals And Techniques

Prof. Dr. Y. Eren Kalay / Middle East Technical University

Coffee Break

From Powder to Performance with ZEISS X-Ray Solutions

Krist Benedikt / Sales Development Manager (ZEISS)

Lunch

Investigations of Electron Beam Melting Processed Structures in Defence Application

Dr. Evren Tan (Aselsan)

Quality Control and Non-Destructive Testing studies in Aviation Parts

Dr. Burcu Arslan Hamat (TAI)

Coffee Break

EKTAM

Yunus Yıldız / Emre Kıvanç Sadak 

Closing Ceremony