Taramalı Elektron & İyon Mikroskopları
Bilimsel ve Rutin Araştırmalar için
Taramalı Elektron Mikroskopları
(TEM)
Taramalı Elektron Mikroskopları (SEM), bir numuneyi elektron ışını ile tarar ve numunelerin topografisi ve kompozisyonu hakkında bilgi alarak görüntüler elde eder.
CSEM'ler (termik elektron kaynağı ile konvansiyonel SEM'ler) ve FE-SEM'ler (alan emisyonlu elektron kaynağı ile alan emisyonlu SEM'ler) ile ZEISS yüksek çözünürlüklü görüntü ve mükemmel malzeme kontrastı sunar.
- Yüksek çözünürlüklü yüzeye duyarlı bilgi ve materyal kontrastı.
- Nanoteknoloji, malzeme araştırmaları, yaşam bilimleri, yarı iletken, hammadde ve endüstride yayın şekilde kullanılır.
Sistemler
![]({"small":"https://images.zeiss.com/Microscopy/LandingPages/Campaign%20Landing%20Pages/global-campaigns/fy1819/materialsscience/engineering-materials/zeiss-crossbeam-550-small.ts-1557910480508.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=8f7331f22d0c2d1d83c5325d1e22f317","large":"https://images.zeiss.com/Microscopy/LandingPages/Campaign%20Landing%20Pages/global-campaigns/fy1819/materialsscience/engineering-materials/zeiss-crossbeam-550-small.ts-1557910480508.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=f3cfabf20a60e2d67f9bc1f958e4b473","medium":"https://images.zeiss.com/Microscopy/LandingPages/Campaign%20Landing%20Pages/global-campaigns/fy1819/materialsscience/engineering-materials/zeiss-crossbeam-550-small.ts-1557910480508.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=1d2c77e29d2e8118724e8a059505ee55","full":"https://images.zeiss.com/Microscopy/LandingPages/Campaign%20Landing%20Pages/global-campaigns/fy1819/materialsscience/engineering-materials/zeiss-crossbeam-550-small.ts-1557910480508.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=ad8292d82114d684bcab989189dd6644"})
Değişken basınç modunda bile nanometre altı çözünürlük ve yüksek verimli algılama ile zahmetsiz görüntüleme.
![]({"small":"https://images.zeiss.com/Microscopy/LandingPages/Campaign%20Landing%20Pages/global-campaigns/fy1819/materialsscience/engineering-materials/zeiss-sigma-500-small.ts-1557844733826.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=1b25ed7961b7a80a01e466136fe9b569","large":"https://images.zeiss.com/Microscopy/LandingPages/Campaign%20Landing%20Pages/global-campaigns/fy1819/materialsscience/engineering-materials/zeiss-sigma-500-small.ts-1557844733826.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=3b6563bca8f55fe2d7143d7c45abab00","medium":"https://images.zeiss.com/Microscopy/LandingPages/Campaign%20Landing%20Pages/global-campaigns/fy1819/materialsscience/engineering-materials/zeiss-sigma-500-small.ts-1557844733826.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=221277cfaca4cf5a3221734b2a1a8bec","full":"https://images.zeiss.com/Microscopy/LandingPages/Campaign%20Landing%20Pages/global-campaigns/fy1819/materialsscience/engineering-materials/zeiss-sigma-500-small.ts-1557844733826.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=91ce834e71dc47a4352e82eedcf3a1f9"})
Alan emisyonu SEM (FE-SEM) teknolojisini gelişmiş analizlerle birleştirin ve Gemini elektron optiklerinden faydalanın.
![]({"small":"https://images.zeiss.com/Microscopy/Products/electron-microscopes/EVO/evo_ls-mat_summarized/evo_smartpi_system.ts-1513155732860.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C108%2C1280%2C720&w=640&s=275c2c2eb0cd1b294d1a07b4c609b223","large":"https://images.zeiss.com/Microscopy/Products/electron-microscopes/EVO/evo_ls-mat_summarized/evo_smartpi_system.ts-1513155732860.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C108%2C1280%2C720&w=1280&s=6ead0cda26c0e01817df75daa0596d37","medium":"https://images.zeiss.com/Microscopy/Products/electron-microscopes/EVO/evo_ls-mat_summarized/evo_smartpi_system.ts-1513155732860.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C108%2C1280%2C720&w=832&s=cb68bb31a902f51be9d40bdfb05562b3","full":"https://images.zeiss.com/Microscopy/Products/electron-microscopes/EVO/evo_ls-mat_summarized/evo_smartpi_system.ts-1513155732860.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C108%2C1280%2C720&w=1920&s=8bf7ef60000bff38e318d17c9a7ac412"})
Sezgisel Operasyon, Rutin Araştırmalar ve Araştırma Uygulamaları için Modüler SEM Platformu.
![]({"small":"https://images.zeiss.com/Microscopy/Products/electron-microscopes/multisem/multisem_stage.ts-1562665200341.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=882%2C64%2C907%2C510&w=640&s=e45a999d87882166e3bd02167b6d1d22","large":"https://images.zeiss.com/Microscopy/Products/electron-microscopes/multisem/multisem_stage.ts-1562665200341.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=882%2C64%2C907%2C510&w=1280&s=621680460715168b0e1cad36895fa9a6","medium":"https://images.zeiss.com/Microscopy/Products/electron-microscopes/multisem/multisem_stage.ts-1562665200341.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=882%2C64%2C907%2C510&w=832&s=1885d326bc4fa46371117b04a2b1bf94","full":"https://images.zeiss.com/Microscopy/Products/electron-microscopes/multisem/multisem_stage.ts-1562665200341.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=882%2C64%2C907%2C510&w=1920&s=fce9fbd2339937bd4c6405812ca043e1"})
91 paralel elektron ışınına kadar görüntüleme hızı. Santimetre boyutlarındaki örnekler için nanometre çözünürlüğünde ölçek.
![]({"small":"https://images.zeiss.com/Microscopy/Products/electron-microscopes/Certified%20refurbished%20instruments/ultra55_stage.ts-1563536281950.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=766%2C54%2C933%2C525&w=640&s=7161e576508a078c4fbaced8ab6eb51c","large":"https://images.zeiss.com/Microscopy/Products/electron-microscopes/Certified%20refurbished%20instruments/ultra55_stage.ts-1563536281950.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=766%2C54%2C933%2C525&w=1280&s=1896b58ec6f05152e46a7dc90e6e0823","medium":"https://images.zeiss.com/Microscopy/Products/electron-microscopes/Certified%20refurbished%20instruments/ultra55_stage.ts-1563536281950.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=766%2C54%2C933%2C525&w=832&s=4b0afe847b757f3dd91118e48054ce10","full":"https://images.zeiss.com/Microscopy/Products/electron-microscopes/Certified%20refurbished%20instruments/ultra55_stage.ts-1563536281950.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=766%2C54%2C933%2C525&w=1920&s=6620343e47873b9526c79fa4eab7b7a0"})
Avantajlı imkanlarla, performans garantili.
Çözümler
![]({"small":"https://images.zeiss.com/Microscopy/Products/electron-microscopes/3view/3view_low-voltage_gemini_border.ts-1510137174373.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C25%2C1280%2C720&w=640&s=2facd0e0b9c7fd428e8e1045342246ca","large":"https://images.zeiss.com/Microscopy/Products/electron-microscopes/3view/3view_low-voltage_gemini_border.ts-1510137174373.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C25%2C1280%2C720&w=1280&s=b51f1d23b650809294667c4ea464a3b8","medium":"https://images.zeiss.com/Microscopy/Products/electron-microscopes/3view/3view_low-voltage_gemini_border.ts-1510137174373.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C25%2C1280%2C720&w=832&s=a486b659c650b8a770591fdad9378606","full":"https://images.zeiss.com/Microscopy/Products/electron-microscopes/3view/3view_low-voltage_gemini_border.ts-1510137174373.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C25%2C1280%2C720&w=1920&s=17016a52cf83607f74e2d8e7f74eff8e"})
Reçineye gömülü hücre ve doku örneklerinizi tekrar tekrar kesin ve görüntüleyin.
![]({"small":"https://images.zeiss.com/Microscopy/Products/electron-microscopes/Mineralogic%20System/minscan_stage.ts-1563274140629.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=885%2C57%2C952%2C535&w=640&s=36da9caa9453904a5fad6885d7c228fb","large":"https://images.zeiss.com/Microscopy/Products/electron-microscopes/Mineralogic%20System/minscan_stage.ts-1563274140629.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=885%2C57%2C952%2C535&w=1280&s=41059c36251ba29b839aad0970cdd347","medium":"https://images.zeiss.com/Microscopy/Products/electron-microscopes/Mineralogic%20System/minscan_stage.ts-1563274140629.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=885%2C57%2C952%2C535&w=832&s=ad55ed21c54239bccc41b4a36ece4a28","full":"https://images.zeiss.com/Microscopy/Products/electron-microscopes/Mineralogic%20System/minscan_stage.ts-1563274140629.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=885%2C57%2C952%2C535&w=1920&s=41b8d006c37b5045cdbe2d052506add8"})
Mineralojik sistemler - otomatik mineraloji için özel çözümler.
![]({"small":"https://images.zeiss.com/Microscopy/Products/electron-microscopes/PST/Mat%20ParticleSCAN/particle-scan-vp_system.ts-1566985740740.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=8b3d2b6ed3960978fdfc91f4b130a525","large":"https://images.zeiss.com/Microscopy/Products/electron-microscopes/PST/Mat%20ParticleSCAN/particle-scan-vp_system.ts-1566985740740.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=407ddbc3e93b19c03ad5594eb7837b99","medium":"https://images.zeiss.com/Microscopy/Products/electron-microscopes/PST/Mat%20ParticleSCAN/particle-scan-vp_system.ts-1566985740740.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=782e56712a062a069e0a363e61758b3b","full":"https://images.zeiss.com/Microscopy/Products/electron-microscopes/PST/Mat%20ParticleSCAN/particle-scan-vp_system.ts-1566985740740.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=7dda4a9865dba369e89ffe1d4846f2af"})
Parçacık büyüklüğü, şekli ve kimyasal bileşimi otomatik olarak gözlemleyin, ölçün, sınıflandırın ve kaydedin.
Odaklanmış İyon Demeti Taramalı Elektron Mikroskobu
(FIB-SEM)
Nanotomografi ve nanofabrikasyon uygulamalarını hızlandırın. ZEISS FIB-SEM'ler, yaşam bilimlerindeki ve endüstrideki malzemeler için nanoskopik ölçekte işleme ve numune hazırlamanıza izin verir.
- 3D görüntüleme, analiz ve malzeme işlemeyi birleştirin
- Örnek hazırlarken yeni nesil FIB'in avantajlarından faydalanın
- Gerçek zamanlı etkileşimin tadını çıkarın ve aynı anda görüntüleme ve frezeleme yapın
![]({"small":"https://images.zeiss.com/Microscopy/Products/electron-microscopes/FIB-SEM/Crossbeam/Stage_Crossbeam.ts-1380285624760.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=393%2C14%2C587%2C294&w=640&s=cc8e9f1313ac2dc2bf9dc1f375c56090","large":"https://images.zeiss.com/Microscopy/Products/electron-microscopes/FIB-SEM/Crossbeam/Stage_Crossbeam.ts-1380285624760.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=393%2C14%2C587%2C294&w=1280&s=bdc3040c18e8f2792995323c6959111a","medium":"https://images.zeiss.com/Microscopy/Products/electron-microscopes/FIB-SEM/Crossbeam/Stage_Crossbeam.ts-1380285624760.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=393%2C14%2C587%2C294&w=832&s=da0773ecd357662f9c47469b59bb78d7","full":"https://images.zeiss.com/Microscopy/Products/electron-microscopes/FIB-SEM/Crossbeam/Stage_Crossbeam.ts-1380285624760.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=393%2C14%2C587%2C294&w=1920&s=81cb36ec3e947ab2d7f70d9001e0939e"})
Tomografide iyon demeti frezeleme veya malzemenin kaldırılmasını hızlandırın ve FIB-SEM analizinizde en iyi 3D çözünürlüğü elde edin.
![]({"small":"https://images.zeiss.com/Microscopy/Products/electron-microscopes/Customized%20Tools/customized-instruments.ts-1378797790698.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=406%2C13%2C570%2C285&w=640&s=0842bdbcfd09e933d3340ba1449c1daa","large":"https://images.zeiss.com/Microscopy/Products/electron-microscopes/Customized%20Tools/customized-instruments.ts-1378797790698.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=406%2C13%2C570%2C285&w=1280&s=74dba4e1228cac80e43c689e3bc49334","medium":"https://images.zeiss.com/Microscopy/Products/electron-microscopes/Customized%20Tools/customized-instruments.ts-1378797790698.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=406%2C13%2C570%2C285&w=832&s=b426c4d0b9f4243e3b7889d33f26f213","full":"https://images.zeiss.com/Microscopy/Products/electron-microscopes/Customized%20Tools/customized-instruments.ts-1378797790698.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=406%2C13%2C570%2C285&w=1920&s=7add069a7270d37c20609602f86f550d"})
Crossbeam ve Merlin platformlarına dayanan size özel çözümlerimiz ile çalışmalarınıza ilham verelim.
Çoklu İyon Demeti Mikroskobu
Your 3-in-1 Ion Microscope for Sub-10 nm Nanostructuring
ORION NanoFab Helyum İyon Mikroskobu
Dünyada galyum, neon ve helyum iyon ışınlarını kullanan tek sistem.
- 10nm alt nanoyapıları hız ve hassasiyetle üretin
- Galyum, neon ve helyum ışınları arasında benzersizce geçiş yapın
- Nanometre altı çözünürlük, yüksek yüzey hassasiyeti ve alan derinliği ile görüntüleme
![]({"small":"https://images.zeiss.com/Microscopy/Products/electron-microscopes/HIM/Mat-ORION-NanoFab/orion_stage.ts-1566804913479.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=604%2C0%2C1145%2C573&w=640&s=9f299357ab2bf6eb448d467ae7a0c217","large":"https://images.zeiss.com/Microscopy/Products/electron-microscopes/HIM/Mat-ORION-NanoFab/orion_stage.ts-1566804913479.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=604%2C0%2C1145%2C573&w=1280&s=4c7f8b136972445e36304657da696cc4","medium":"https://images.zeiss.com/Microscopy/Products/electron-microscopes/HIM/Mat-ORION-NanoFab/orion_stage.ts-1566804913479.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=604%2C0%2C1145%2C573&w=832&s=56052f126aa86321fb946bef3bf5b11c","full":"https://images.zeiss.com/Microscopy/Products/electron-microscopes/HIM/Mat-ORION-NanoFab/orion_stage.ts-1566804913479.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=604%2C0%2C1145%2C573&w=1920&s=c3fda143b670b1e92fd96a614afc4002"})
ORION NanoFab
Yüksek Çözünürlüklü Görüntüleme ve 10nm Altı Üretim Sistemi
Yüklü örneklerin ve nanofabrikasyon uygulamalarının 10 nanometre altı görüntülenmesinde sınırları aşın.
![]({"small":"https://images.zeiss.com/Microscopy/Products/Correlative%20Microscopy/Shuttle%20&%20Find%20Bio/corr-mic-bio.ts-1561025030586.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C256%2C1920%2C960&w=640&s=ef55dbac4ba2692b46312dec14991242","large":"https://images.zeiss.com/Microscopy/Products/Correlative%20Microscopy/Shuttle%20&%20Find%20Bio/corr-mic-bio.ts-1561025030586.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C256%2C1920%2C960&w=1280&s=72dea381aaeccedbcc27c12488e1843d","medium":"https://images.zeiss.com/Microscopy/Products/Correlative%20Microscopy/Shuttle%20&%20Find%20Bio/corr-mic-bio.ts-1561025030586.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C256%2C1920%2C960&w=832&s=6ac1f010cf8206c424ca0ef60ade774b","full":"https://images.zeiss.com/Microscopy/Products/Correlative%20Microscopy/Shuttle%20&%20Find%20Bio/corr-mic-bio.ts-1561025030586.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C256%2C1920%2C960&w=1920&s=6cd0712f671157f521d048983d49a504"})
![]({"small":"https://images.zeiss.com/Microscopy/Products/overview_products/upgrade-infos.ts-1521639733805.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=55fc98557ccc7199232d8b39f3fa877e","large":"https://images.zeiss.com/Microscopy/Products/overview_products/upgrade-infos.ts-1521639733805.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=272a36501cfe73e1fb4acb8b4292ed35","medium":"https://images.zeiss.com/Microscopy/Products/overview_products/upgrade-infos.ts-1521639733805.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=c2feaeb0133f43e5fd22d3f268ab20cc","full":"https://images.zeiss.com/Microscopy/Products/overview_products/upgrade-infos.ts-1521639733805.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=e7cb96edd7f0b29761d273f486b963f1"})